CVE-2017-18313

Published Oct 23, 2018

Last updated 5 years ago

Overview

Description
Under certain mode of operations, HLOS may be able get direct or indirect access through DXE channels to tamper with the authenticated WCNSS firmware stored in DDR because DXE-accessible memory is located within the authenticated image in Snapdragon Mobile and Snapdragon Wear in version MSM8909W, SD 210/SD 212/SD 205, SD 410/12, SD 615/16/SD 415, SD 617.
Source
product-security@qualcomm.com
NVD status
Analyzed

Risk scores

CVSS 3.0

Type
Primary
Base score
5.3
Impact score
3.6
Exploitability score
1.6
Vector string
CVSS:3.0/AV:A/AC:H/PR:N/UI:N/S:U/C:N/I:H/A:N
Severity
MEDIUM

CVSS 2.0

Type
Primary
Base score
5.7
Impact score
6.9
Exploitability score
5.5
Vector string
AV:A/AC:M/Au:N/C:N/I:C/A:N

Weaknesses

nvd@nist.gov
NVD-CWE-noinfo

Social media

Hype score
Not currently trending

Configurations