CVE-2017-18696

Published Apr 7, 2020

Last updated 5 years ago

Overview

Description
An issue was discovered on Samsung mobile devices with M(6.0) and N(7.0) (Exynos7420, Exynos8890, or MSM8996 chipsets) software. RKP allows memory corruption. The Samsung ID is SVE-2016-7897 (January 2017).
Source
cve@mitre.org
NVD status
Analyzed

Risk scores

CVSS 3.1

Type
Primary
Base score
9.8
Impact score
5.9
Exploitability score
3.9
Vector string
CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
Severity
CRITICAL

CVSS 2.0

Type
Primary
Base score
7.5
Impact score
6.4
Exploitability score
10
Vector string
AV:N/AC:L/Au:N/C:P/I:P/A:P

Weaknesses

nvd@nist.gov
CWE-119

Social media

Hype score
Not currently trending

Configurations