CVE-2018-11279

Published Jan 18, 2019

Last updated 6 years ago

Overview

Description
Lack of check of input size can make device memory get corrupted because of buffer overflow in snapdragon automobile, snapdragon mobile and snapdragon wear in versions MDM9206, MDM9607, MDM9615, MDM9625, MDM9635M, MDM9640, MDM9645, MDM9650, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 615/16/SD 415, SD 625, SD 636, SD 650/52, SD 712 / SD 710 / SD 670, SD 810, SD 820, SD 820A, SD 835, SD 845 / SD 850, SDA660, SDM439, SDM630, SDM660, SDX20, Snapdragon_High_Med_2016, SXR1130
Source
product-security@qualcomm.com
NVD status
Analyzed

Risk scores

CVSS 3.0

Type
Primary
Base score
8.8
Impact score
5.9
Exploitability score
2.8
Vector string
CVSS:3.0/AV:A/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
Severity
HIGH

CVSS 2.0

Type
Primary
Base score
8.3
Impact score
10
Exploitability score
6.5
Vector string
AV:A/AC:L/Au:N/C:C/I:C/A:C

Weaknesses

nvd@nist.gov
CWE-119

Social media

Hype score
Not currently trending

Configurations