CVE-2018-13888

Published Feb 11, 2019

Last updated 6 years ago

Overview

Description
There is potential for memory corruption in the RIL daemon due to de reference of memory outside the allocated array length in RIL in Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables in versions MDM9206, MDM9607, MDM9635M, MDM9650, MSM8909W, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 625, SD 636, SD 650/52, SD 675, SD 712 / SD 710 / SD 670, SD 820A, SD 835, SD 845 / SD 850, SD 855, SDM439, SDM630, SDM660, ZZ_QCS605.
Source
product-security@qualcomm.com
NVD status
Analyzed

Risk scores

CVSS 3.0

Type
Primary
Base score
7.8
Impact score
5.9
Exploitability score
1.8
Vector string
CVSS:3.0/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
Severity
HIGH

CVSS 2.0

Type
Primary
Base score
7.2
Impact score
10
Exploitability score
3.9
Vector string
AV:L/AC:L/Au:N/C:C/I:C/A:C

Weaknesses

nvd@nist.gov
CWE-119

Social media

Hype score
Not currently trending

Configurations