CVE-2019-20556

Published Mar 24, 2020

Last updated 4 years ago

Overview

Description
An issue was discovered on Samsung mobile devices with P(9.0) (SM6150, SM8150, SM8150_FUSION, exynos7885, exynos9610, and exynos9820 chipsets) software. RKP memory corruption allows attackers to control the effective address in EL2. The Samsung ID is SVE-2019-15221 (October 2019).
Source
cve@mitre.org
NVD status
Analyzed

Risk scores

CVSS 3.1

Type
Primary
Base score
9.8
Impact score
5.9
Exploitability score
3.9
Vector string
CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
Severity
CRITICAL

CVSS 2.0

Type
Primary
Base score
7.5
Impact score
6.4
Exploitability score
10
Vector string
AV:N/AC:L/Au:N/C:P/I:P/A:P

Weaknesses

nvd@nist.gov
CWE-787

Social media

Hype score
Not currently trending

Configurations