CVE-2019-20607

Published Mar 24, 2020

Last updated 5 years ago

Overview

Description
An issue was discovered on Samsung mobile devices with N(7.x), O(8.x), and P(9.0) (MSM8996, MSM8998, Exynos7420, Exynos7870, Exynos8890, and Exynos8895 chipsets) software. A heap overflow in the keymaster Trustlet allows attackers to write to TEE memory, and achieve arbitrary code execution. The Samsung ID is SVE-2019-14126 (May 2019).
Source
cve@mitre.org
NVD status
Analyzed

Risk scores

CVSS 3.1

Type
Primary
Base score
9.8
Impact score
5.9
Exploitability score
3.9
Vector string
CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
Severity
CRITICAL

CVSS 2.0

Type
Primary
Base score
10
Impact score
10
Exploitability score
10
Vector string
AV:N/AC:L/Au:N/C:C/I:C/A:C

Weaknesses

nvd@nist.gov
CWE-787

Social media

Hype score
Not currently trending

Configurations