Overview
- Description
- There is a Memory leakage vulnerability in Smartphone.Successful exploitation of this vulnerability may cause memory exhaustion.
- Source
- psirt@huawei.com
- NVD status
- Analyzed
Risk scores
CVSS 3.1
- Type
- Primary
- Base score
- 7.5
- Impact score
- 3.6
- Exploitability score
- 3.9
- Vector string
- CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:N/I:N/A:H
- Severity
- HIGH
CVSS 2.0
- Type
- Primary
- Base score
- 5
- Impact score
- 2.9
- Exploitability score
- 10
- Vector string
- AV:N/AC:L/Au:N/C:N/I:N/A:P
Weaknesses
- nvd@nist.gov
- CWE-770
Social media
- Hype score
- Not currently trending
Configurations
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