CVE-2022-25696

Published Sep 16, 2022

Last updated 2 years ago

Overview

Description
Memory corruption in display due to time-of-check time-of-use race condition during map or unmap in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables
Source
product-security@qualcomm.com
NVD status
Analyzed

Risk scores

CVSS 3.1

Type
Primary
Base score
7
Impact score
5.9
Exploitability score
1
Vector string
CVSS:3.1/AV:L/AC:H/PR:L/UI:N/S:U/C:H/I:H/A:H
Severity
HIGH

Weaknesses

nvd@nist.gov
CWE-367

Social media

Hype score
Not currently trending

Configurations