CVE-2022-35858

Published Aug 4, 2022

Last updated 2 years ago

Overview

Description: The TEE_PopulateTransientObject and __utee_from_attr functions in Samsung mTower 0.3.0 allow a trusted application to trigger a memory overwrite, denial of service, and information disclosure by invoking the function TEE_PopulateTransientObject with a large number in the parameter attrCount.
Source: cve@mitre.org
NVD status: Analyzed

Risk scores

CVSS 3.1

Type: Primary
Base score: 7.8
Impact score: 5.9
Exploitability score: 1.8
Vector string: CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
Severity: HIGH

Weaknesses

nvd@nist.gov: CWE-401

Hype score: Not currently trending

Configurations

[
  {
    "nodes": [
      {
        "negate": false,
        "cpeMatch": [
          {
            "criteria": "cpe:2.3:a:samsung:mtower:0.3.0:*:*:*:*:*:*:*",
            "vulnerable": true,
            "matchCriteriaId": "5BCFFBF4-D702-4AE7-9022-337184251075"
          }
        ],
        "operator": "OR"
      }
    ]
  }
]

References